The temperature digital probe with high metrological quality and designed for X2 modelling

The Digital Sensor Evolution X2 is a digital temperature sensor with a low drift (type ≤0.1°C) after one year of use.

It has an internal memory storing its calibration coefficients. Interchangeable, it allows calibration to be carried out by simple exchange or using the JRI MySirius Calibration module without interrupting equipment monitoring.

The data from a metrological operation is automatically transferred to the JRI software.

This designer digital probe for X2 modelling is compatible with LoRa SPY Digital and Nano SPY Digital mini data loggers.